CIF: Re-tune wafer-scanner benchmark variable order settings

The wafer-scanner_n1 and wafer_scanner_n2 benchmark models contain settings for variable ordering that are no longer optimal. These settings were fine-tuned before saturation was introduced in CIF. In ESCET v8.0, these custom settings are way outperformed by even the default settings. Ideally, an experiment to determine the right settings should be performed.